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A study of structural transition in nanocrystalline titania thin films by X-ray diffraction Rietveld method

✍ Scribed by S. Murugesan; N. Padhy; P. Kuppusami; U. Kamachi Mudali; E. Mohandas


Book ID
113787127
Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
505 KB
Volume
45
Category
Article
ISSN
0025-5408

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