𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Reversible-logic design with online testability

✍ Scribed by Vasudevan, D.P.; Lala, P.K.; Jia Di; Parkerson, J.P.


Book ID
114630152
Publisher
IEEE
Year
2006
Tongue
English
Weight
486 KB
Volume
55
Category
Article
ISSN
0018-9456

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Design of Testable Logic Circuits
✍ Taylor, G.E. πŸ“‚ Article πŸ“… 1985 πŸ› The Institution of Electrical Engineers βš– 72 KB
Towards a Design Flow for Reversible Log
✍ Wille, Robert; Drechsler, Rolf πŸ“‚ Article πŸ“… 2010 πŸ› Springer Netherlands 🌐 Dutch βš– 870 KB

The development of computing machines found great success in the last decades. But the ongoing miniaturization of integrated circuits will reach its limits in the near future. Shrinking transistor sizes and power dissipation are the major barriers in the development of smaller and more powerful circ

Universal syndrome-testable design of pr
✍ Ted C. Yang; Che W. Chiou πŸ“‚ Article πŸ“… 1990 πŸ› Elsevier Science 🌐 English βš– 409 KB

This paper presents a new technique to convert a PLA into a testable PLA. Only one extra input, one extra product line, and one extra output are added for the augmented PLA. The augmented PLA can operate in three modes: the normal operating mode, the self-checking mode, and the universal syndrome te

Towards a Design Flow for Reversible Log
✍ Wille, Robert; Drechsler, Rolf πŸ“‚ Article πŸ“… 2010 πŸ› Springer Netherlands 🌐 Dutch βš– 630 KB

The development of computing machines found great success in the last decades. But the ongoing miniaturization of integrated circuits will reach its limits in the near future. Shrinking transistor sizes and power dissipation are the major barriers in the development of smaller and more powerful circ