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Testable design of AND–EXOR logic networks with universal test sets

✍ Scribed by Hafizur Rahaman; Debesh K. Das; Bhargab B. Bhattacharya

Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 604 KB
Volume: 35
Category: Article
ISSN: 0045-7906
DOI: 10.1016/j.compeleceng.2009.01.006

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