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Resistivity of Copper Films at Thicknesses Near the Mean Free Path of Electrons in Copper Minimization of the Diffuse Scattering in Copper

✍ Scribed by Mallikarjunan, A.

Book ID
121465349
Publisher
The Electrochemical Society
Year
1999
Tongue
English
Weight
39 KB
Volume
3
Category
Article
ISSN
1099-0062

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