Determination of the inelastic mean free paths of electrons in copper and copper oxides by elastic peak electron spectroscopy (EPES)
β Scribed by Lesiak, B.; Jablonski, A.; Zemek, J.; Jiricek, P.
- Publisher
- John Wiley and Sons
- Year
- 1998
- Tongue
- English
- Weight
- 412 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0142-2421
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β¦ Synopsis
Theoretical values of the inelastic mean free path (IMFP) and their electron-energy dependence are available in the literature from predictive formulae for various categories of materials, such as elemental solids, inorganic and organic compounds. in contrast, the experimental IMFP values were determined for a more limited number of materials. This refers especially to multicomponent solids.
We have measured the IMFP dependence on energy for Cu and two copper oxides, CuO and using elastic Cu 2 O, peak electron spectroscopy. The experiment consisted of measuring the backscattering probabilities for the investigated materials and an Ni standard in the energy range 400-1600 eV. The IMFP values were determined using a theoretical model describing the phenomenon of elastic backscattering. The IMFP values determined in this work are in reasonable agreement with experimental and theoretical values published in the literature.
1998 John ( Wiley & Sons, Ltd.
π SIMILAR VOLUMES
Elastic peak depth proΓling was carried out on an Mo/Si multilayer system using a rotating specimen, grazing angle of incidence (86Γ with respect to the surface normal) and 0.5 keV Ar ion energy. The depth proΓling was simulated by dynamic TRIM (T-DYN) code. The T-DYN code provided the in-depth dist