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Residual stress measurement in PVD optical coatings by microtopography

✍ Scribed by Manuel F.M. Costa; V. Teixeira

Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 576 KB
Volume: 44
Category: Article
ISSN: 0263-2241
DOI: 10.1016/j.measurement.2010.11.010

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