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Residual stress analysis of TiN film fabricated by plasma immersion ion implantation and deposition process

✍ Scribed by Liu, Hongxi; Xu, Qian; Zhang, Xiaowei; Wang, Chuanqi; Tang, Baoyin


Book ID
120049895
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
467 KB
Volume
297
Category
Article
ISSN
0168-583X

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