Residual strain measurements in InGaAs metamorphic buffer layers on GaAs

✍ Scribed by V. Bellani; C. Bocchi; T. Ciabattoni; S. Franchi; P. Frigeri; P. Galinetto; M. Geddo; F. Germini; G. Guizzetti; L. Nasi; M. Patrini; L. Seravalli; G. Trevisi

• Book ID: 111622199
• Publisher: Springer
• Year: 2007
• Tongue: English
• Weight: 292 KB
• Volume: 56
• Category: Article
• ISSN: 1434-6036
• DOI: 10.1140/epjb/e2007-00105-8