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Reliability problems of submicron MOS transistors and circuits

✍ Scribed by Wolfgang H. Krautschneider; Hartmud Terletzki; Qin Wang

Publisher: Elsevier Science
Year: 1992
Tongue: English
Weight: 827 KB
Volume: 32
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(92)90447-s

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