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Reliability of high frequency high power GaAs MESFETs : S. Kashiwagi, S. Takase, T. Usui and T. Ohono. Annual Proceedings of the Reliability Physics Symposium, San Diego, U.S.A., p. 97 (1987)


Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
127 KB
Volume
28
Category
Article
ISSN
0026-2714

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