Reliability of high frequency high power GaAs MESFETs : S. Kashiwagi, S. Takase, T. Usui and T. Ohono. Annual Proceedings of the Reliability Physics Symposium, San Diego, U.S.A., p. 97 (1987)

• Publisher: Elsevier Science
• Year: 1988
• Tongue: English
• Weight: 127 KB
• Volume: 28
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(88)90026-1