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Reliability issues in 650V high voltage bipolar-CMOS-DMOS integrated circuits

✍ Scribed by Jacob A. van der Pol; Han J. Gerritsen; Rene T.H. Rongen; Peter P.M.C. Groeneveld; Peter W. Ragay; Henk A. van den Hurk

Book ID: 108362239
Publisher: Elsevier Science
Year: 1997
Tongue: English
Weight: 318 KB
Volume: 37
Category: Article
ISSN: 0026-2714
DOI: 10.1016/s0026-2714(97)00148-0

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