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Reliability growth of electronic equipment : P. H. Mead. Microelectron. and Reliab.14, 439 (1975)

Publisher: Elsevier Science
Year: 1976
Tongue: English
Weight: 117 KB
Volume: 15
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(76)90418-2

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