✦ LIBER ✦

Reliability evaluation of thick film resistors through measurement of third harmonic index

Book ID: 108362140
Publisher: Elsevier Science
Year: 1982
Tongue: English
Weight: 250 KB
Volume: 22
Category: Article
ISSN: 0026-2714
DOI: 10.1016/s0026-2714(82)80706-3

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Evaluation of thick-film resistor struct

Evaluation of thick-film resistor structural parameters based on noise index measurements

✍ M.M Jevtić; Z Stanimirović; I Stanimirović 📂 Article 📅 2001 🏛 Elsevier Science 🌐 English ⚖ 306 KB

Evaluation of film thickness dependency

Evaluation of film thickness dependency of the reversible fluxoid motion in the third harmonic voltage method

✍ T. Yoshida; M. Shibata; M. Kiuchi; E.S. Otabe; T. Matsushita; M. Futamura; H. Ko 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 210 KB

Significant overestimation of the critical current density J c is found for the third harmonic voltage measurement method for thin YBCO superconductors. This is caused by a reversible flux motion in pinning potentials, which is known to be significant for superconductors of thickness comparable to o

Component linearity test improves reliab

Component linearity test improves reliability screening through measurement of third harmonic index : A. Salomon and T. Troianello. IEEE 11th Annual Proceedings Reliability Physics (1973). p. 69

📂 Article 📅 1973 🏛 Elsevier Science 🌐 English ⚖ 83 KB

Evaluation of uncertainty in the inducti

Evaluation of uncertainty in the inductive measurement of critical current densities of superconducting films using third-harmonic voltages

✍ H. Yamasaki; Y. Mawatari; Y. Nakagawa; H. Yamada 📂 Article 📅 2012 🏛 Elsevier Science 🌐 English ⚖ 936 KB

Evaluation of the noise index in laser-t

Evaluation of the noise index in laser-trimmed thick-film resistors : D. A. Bianchi and A. Cattaneo. IERE Conf. Hybrid Microelectronics, Loughborough p. 205. 9–11 Sept. 1975

📂 Article 📅 1976 🏛 Elsevier Science 🌐 English ⚖ 115 KB