𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Evaluation of thick-film resistor structural parameters based on noise index measurements

✍ Scribed by M.M Jevtić; Z Stanimirović; I Stanimirović


Book ID
108361795
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
306 KB
Volume
41
Category
Article
ISSN
0026-2714

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES