Evaluation of the noise index in laser-trimmed thick-film resistors : D. A. Bianchi and A. Cattaneo. IERE Conf. Hybrid Microelectronics, Loughborough p. 205. 9–11 Sept. 1975

• Publisher: Elsevier Science
• Year: 1976
• Tongue: English
• Weight: 115 KB
• Volume: 15
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(76)90744-7