Reliability Comparison of Triple-Gate Versus Planar SOI FETs

✍ Scribed by Crupi, F.; Kaczer, B.; Degraeve, R.; Subramanian, V.; Srinivasan, P.; Simoen, E.; Abhisek Dixit; Jurczak, M.; Groeseneken, G.

• Book ID: 114618398
• Publisher: IEEE
• Year: 2006
• Tongue: English
• Weight: 399 KB
• Volume: 53
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2006.880824