✦ LIBER ✦
Performance Comparisons of III–V and Strained-Si in Planar FETs and Nonplanar FinFETs at Ultrashort Gate Length (12 nm)
✍ Scribed by Park, S. H.; Liu, Y.; Kharche, N.; Salmani Jelodar, M.; Klimeck, G.; Lundstrom, M. S.; Luisier, M.
- Book ID
- 114621010
- Publisher
- IEEE
- Year
- 2012
- Tongue
- English
- Weight
- 624 KB
- Volume
- 59
- Category
- Article
- ISSN
- 0018-9383
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