Reliability and thermal impedance studies in soft soldered power transistors

✍ Scribed by Zommer, N.D.; Feucht, D.L.; Heckel, R.W.

• Book ID: 114592142
• Publisher: IEEE
• Year: 1976
• Tongue: English
• Weight: 1023 KB
• Volume: 23
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1976.18497