𝔖 Bobbio Scriptorium
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Thermal fatigue failure of soft-soldered contacts to silicon power transistors : Sung K. Kang, Nathan D. Zommer, Donald L. Feucht and Richard W. Heckel. IEEE Trans. Parts. Hybrids. PackagingPHP-13, (3) 318 (Sept. 1977)


Publisher
Elsevier Science
Year
1978
Tongue
English
Weight
226 KB
Volume
17
Category
Article
ISSN
0026-2714

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