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Reliability analysis of MOS varactor in CMOS LC VCO

✍ Scribed by Yidong Liu

Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 241 KB
Volume: 42
Category: Article
ISSN: 0026-2692
DOI: 10.1016/j.mejo.2010.12.003

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