Relative sensitivity factors of elements in quantitative secondary ion mass spectrometric analysis of biological reference materials
β Scribed by Ramseyer, G. O.; Morrison, G. H.
- Book ID
- 120311073
- Publisher
- American Chemical Society
- Year
- 1983
- Tongue
- English
- Weight
- 949 KB
- Volume
- 55
- Category
- Article
- ISSN
- 0003-2700
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π SIMILAR VOLUMES
## Abstract SIMS relative sensitivity factors and detection limits are reported for seventeen elements in epitaxiallyβgrown ZnSe on GaAs, using oxygen and cesium primary ion beams. Analytical considerations necessary for obtaining the lowest detection limits are discussed.
Round-robin studies on relative sensitivity factors (RSFs) in secondary ion mass spectrometry (SIMS) were conducted using bulk GaAs samples uniformly doped with various impurity elements. A total of 31 laboratories participated in two round-robins. More than 30 sets of relative ion intensities were