𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Relative sensitivity factors of elements in quantitative secondary ion mass spectrometric analysis of biological reference materials

✍ Scribed by Ramseyer, G. O.; Morrison, G. H.


Book ID
120311073
Publisher
American Chemical Society
Year
1983
Tongue
English
Weight
949 KB
Volume
55
Category
Article
ISSN
0003-2700

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Analysis of zinc selenide by secondary i
✍ Steven J. Pachuta; Terry L. Smith πŸ“‚ Article πŸ“… 1992 πŸ› John Wiley and Sons 🌐 English βš– 360 KB

## Abstract SIMS relative sensitivity factors and detection limits are reported for seventeen elements in epitaxially‐grown ZnSe on GaAs, using oxygen and cesium primary ion beams. Analytical considerations necessary for obtaining the lowest detection limits are discussed.

Secondary ion mass spectrometry round-ro
✍ Homma, Y.; Tohjou, F.; Masamoto, A.; Shibata, M.; Shichi, H.; Yoshioka, Y.; Adac πŸ“‚ Article πŸ“… 1998 πŸ› John Wiley and Sons 🌐 English βš– 330 KB πŸ‘ 2 views

Round-robin studies on relative sensitivity factors (RSFs) in secondary ion mass spectrometry (SIMS) were conducted using bulk GaAs samples uniformly doped with various impurity elements. A total of 31 laboratories participated in two round-robins. More than 30 sets of relative ion intensities were