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Relating Critical Currents to Defect Populations in Superconductors

✍ Scribed by Long, N. J.; Wimbush, S. C.; Strickland, N. M.; Talantsev, E. F.; D'Souza, P.; Xia, J. A.; Knibbe, R.

Book ID
118741054
Publisher
IEEE
Year
2013
Tongue
English
Weight
244 KB
Volume
23
Category
Article
ISSN
1051-8223

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