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Refractive indices of InAlAs and InGaAs/InP from 250 to 1900 nm determined by spectroscopic ellipsometry

✍ Scribed by H.W. Dinges; H. Burkhard; R. Lösch; H. Nickel; W. Schlapp


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
312 KB
Volume
54
Category
Article
ISSN
0169-4332

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