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Spectroscopic ellipsometry: a useful tool to determine the refractive indices and interfaces of In0.52Al0.48As and In0.53AlxGa0.47 - xAs on InP in the wavelength range from 280 to 1900 nm

✍ Scribed by H.W. Dinges; H. Burkhard; R. Lösch; H. Nickel; W. Schlapp


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
280 KB
Volume
233
Category
Article
ISSN
0040-6090

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