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Spectroscopic ellipsometry: a useful tool to determine the refractive indices and interfaces of In0.52Al0.48As and In0.53AlxGa0.47−xAs layers on InP in the wavelength range 280–1900 nm

✍ Scribed by H.W. Dinges; H. Burkhard; R. Lösch; H. Nickel; W. Schlapp

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Spectroscopic ellipsometry: a useful too

✍ H.W. Dinges; H. Burkhard; R. Lösch; H. Nickel; W. Schlapp 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 280 KB

Determination of refractive indices of I

✍ H.W. Dinges; H. Burkhard; R. Lösch; H. Nickel; W. Schlapp 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 327 KB

Determination of refractive indexes of I

✍ H.W. Dinges; H. Burkhard; R. Lösch; H. Nickel; W. Schlapp 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 287 KB

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✍ H.W. Dinges; H. Burkhard; R. Lösch; H. Nickel; W. Schlapp 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 283 KB