Reflection near-field scanning optical microscopy: an interferometric approach
β Scribed by Saeed Pilevar; Walid A. Atia; Christopher C. Davis
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 427 KB
- Volume
- 61
- Category
- Article
- ISSN
- 0304-3991
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
## Abstract This manuscript reviews the principles and recent advances of scanning nearβfield optical microscopy based on tipβinduced field enhancement. These scanning microscopes utilize minute probes to locally enhance an electromagnetic field through a complex interplay between surface plasmon e
The validity of reflection-back-to-the-fiber SNOM (scanning near-field optical microscopy) has been unduely questioned by an erratic approach curve that disputed the enhancement of near-field reflectance. It is shown now that only truncated (broken) tips without metal coating do not experience the e