Scanning near-field optical microscopy b
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Gerd Kaupp; Andreas Herrmann
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Article
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1999
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John Wiley and Sons
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English
โ 62 KB
๐ 2 views
The validity of reflection-back-to-the-fiber SNOM (scanning near-field optical microscopy) has been unduely questioned by an erratic approach curve that disputed the enhancement of near-field reflectance. It is shown now that only truncated (broken) tips without metal coating do not experience the e