๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Dielectric and fluorescent samples imaged by scanning near-field optical microscopy in reflection

โœ Scribed by A. Jalocha; N.F. van Hulst


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
530 KB
Volume
119
Category
Article
ISSN
0030-4018

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Scanning near-field optical microscopy b
โœ Gerd Kaupp; Andreas Herrmann ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 62 KB ๐Ÿ‘ 2 views

The validity of reflection-back-to-the-fiber SNOM (scanning near-field optical microscopy) has been unduely questioned by an erratic approach curve that disputed the enhancement of near-field reflectance. It is shown now that only truncated (broken) tips without metal coating do not experience the e

Scanning Near-field Optical Microscopy i
โœ Andrea JauรŸ; Joachim Koenen; Klaus Weishaupt; Olaf Hollricher ๐Ÿ“‚ Article ๐Ÿ“… 2002 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 449 KB ๐Ÿ‘ 2 views