Scanning near-field optical microscopy of fluorescent polystyrene spheres with a combined SNOM and AFM

Interface Applications of Scanning Near-

Interface Applications of Scanning Near-Field Optical Microscopy with a Free Electron Laser

✍ Cricenti, A. ;Generosi, R. ;Perfetti, P. ;Margaritondo, G. ;Almeida, J. ;Gilliga 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 384 KB 👁 2 views

The study of semiconductor interfaces and of solid interfaces in general requires novel instrument capable to investigate the lateral fluctuations of properties on a microscopic scale. We present the first result of a major effort in that framework, whose main objective is the exploitation of the un