𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Reflection and transmission ellipsometry of a uniform layer

✍ Scribed by Dorf, Michael C.; Lekner, John

Book ID
115386444
Publisher
Optical Society of America
Year
1987
Tongue
English
Weight
471 KB
Volume
4
Category
Article
ISSN
1084-7529

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Reflection and transmission ellipsometry
Reflection and transmission ellipsometry data analysis for measuring the complex permittivity of a single-layer material at microwave frequencies
✍ F. Sagnard; D. Seetharamdoo; V. Le Glaunec πŸ“‚ Article πŸ“… 2002 πŸ› John Wiley and Sons 🌐 English βš– 254 KB

## Abstract For in situ measurement of the complex permittivity of planar materials, a free‐space system based on reflection or transmission ellipsometry has been developed and extended to microwave frequencies. Different angles of incidence were studied in the range [35–50Β°]. Original numerical me