𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Reflected electron energy loss microscopy and scanning Auger microscopy studies of electron irradiated alkali halide surfaces

✍ Scribed by E. Paparazzo; N. Zema

Book ID
117216995
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
704 KB
Volume
372
Category
Article
ISSN
0039-6028

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Reflected Electron Energy-loss Microscop
Reflected Electron Energy-loss Microscopy and Scanning Auger Microscopy Study of Semiconductor Surfaces
✍ Paparazzo, E. πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 495 KB πŸ‘ 2 views

The diagnostic potential of reΓ‘ected electron energy-loss microscopy (REELM) and scanning Auger microscopy (SAM) are explored with respect to two particular aspects encountered in the surface microchemical analysis of semiconductor materials : determining the kind of coverage, i.e. whether continuou