Analysis of frequency-dependent series r
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A. Birkan SelΓ§uk; N. TuΔluoΔlu; S. Karadeniz; S. Bilge Ocak
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Article
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2007
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Elsevier Science
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English
β 506 KB
In this work, the investigation of the interface state density and series resistance from capacitance-voltage (C-V) and conductance-voltage (G/oΓV) characteristics in In/SiO 2 /p-Si metal-insulator-semiconductor (MIS) structures with thin interfacial insulator layer have been reported. The thickness