𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Reduction of the concentration of slow insulator states in SiO2/InP-MIS structures

✍ Scribed by W. Kulisch; H. Rombach; R. Kassing


Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
303 KB
Volume
30
Category
Article
ISSN
0169-4332

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Analysis of frequency-dependent series r
✍ A. Birkan SelΓ§uk; N. Tuğluoğlu; S. Karadeniz; S. Bilge Ocak πŸ“‚ Article πŸ“… 2007 πŸ› Elsevier Science 🌐 English βš– 506 KB

In this work, the investigation of the interface state density and series resistance from capacitance-voltage (C-V) and conductance-voltage (G/oΓ€V) characteristics in In/SiO 2 /p-Si metal-insulator-semiconductor (MIS) structures with thin interfacial insulator layer have been reported. The thickness