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On the profile of frequency and voltage dependent interface states and series resistance in MIS structures

✍ Scribed by İlbilge Dökme; Şemsettin Altındal

Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
349 KB
Volume
393
Category
Article
ISSN
0921-4526

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✍ A. Birkan Selçuk; N. Tuğluoğlu; S. Karadeniz; S. Bilge Ocak 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 506 KB

In this work, the investigation of the interface state density and series resistance from capacitance-voltage (C-V) and conductance-voltage (G/oÀV) characteristics in In/SiO 2 /p-Si metal-insulator-semiconductor (MIS) structures with thin interfacial insulator layer have been reported. The thickness