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On the energy distribution profile of interface states obtained by taking into account of series resistance in Al/TiO2/p–Si (MIS) structures

✍ Scribed by O. Pakma; N. Serin; T. Serin; Ş. Altındal


Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
481 KB
Volume
406
Category
Article
ISSN
0921-4526

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