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Reduction of test effort. Looking for more acceleration for reliable components for automotive applications

✍ Scribed by Pufall, R.; Kanert, W.; Aresu, S.; Goroll, M.

Book ID: 108210777
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 824 KB
Volume: 48
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2008.07.034

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