More than a decade of the non-saturating autoclave as a highly accelerated stress technique for evaluating the reliability of nonhermetic microelectronic components : N. Sinnadurai. Microelectron. Reliab.23 (5), 833 (1983)

• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 132 KB
• Volume: 24
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(84)90234-8