More than a decade of the non-saturating autoclave as a highly accelerated stress technique for evaluating the reliability of nonhermetic microelectronic components

✍ Scribed by N. Sinnadurai

• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 531 KB
• Volume: 23
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(83)91007-7