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Real-time in situ monitoring of antireflection coatings for semiconductor laser amplifiers by ellipsometry

✍ Scribed by Wu, I.-F.; Riant, I.; Verdiell, J.-M.; Dagenais, M.

Book ID: 119783516
Publisher: IEEE
Year: 1992
Tongue: English
Weight: 311 KB
Volume: 4
Category: Article
ISSN: 1041-1135
DOI: 10.1109/68.157125

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