The depth of disorder generation in low
✦ LIBER ✦
RBS and SIMS measurements of the fluence dependence of the range distributions of Pb implanted into Si(111) crystals: S Kostic, JJ Jimenez-Rodriguez and DG Armour,Department of Electronic and Electrical Engineering, University of Salford, Salford M5 4WT, UK
- Publisher
- Elsevier Science
- Year
- 1984
- Tongue
- English
- Weight
- 120 KB
- Volume
- 34
- Category
- Article
- ISSN
- 0042-207X
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