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Rapid Delineation of Extended Defects in GaN and a Novel Method for Their Reduction

✍ Scribed by Visconti, P. ;Huang, D. ;Yun, F. ;Reshchikov, M.A. ;King, T. ;Cingolani, R. ;Jasinski, J. ;Liliental-Weber, Z. ;Morko�, H.


Publisher
John Wiley and Sons
Year
2002
Tongue
English
Weight
328 KB
Volume
190
Category
Article
ISSN
0031-8965

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