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Raman study of the stress in MBE-grown AlxGa1-xAs on Si

✍ Scribed by Kanji Iizuka; Takashi Yoshida; Makoto Hasobe; Ikuo Matsuda; Toshimasa Suzuki

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 295 KB
Volume: 41-42
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(89)90127-x

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