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Raman spectroscopy—A versatile tool for characterization of thin films and heterostructures of GaAs and AlxGa1−xAs

✍ Scribed by G. Abstreiter; E. Bauser; A. Fischer; K. Ploog

Book ID: 104993115
Publisher: Springer
Year: 1978
Tongue: English
Weight: 714 KB
Volume: 16
Category: Article
ISSN: 1432-0630
DOI: 10.1007/bf00885858

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