Depth profiles of photoluminescence (PL) and Raman scattering properties of anodized porous Si have been studied by micro-measurement techniques. The depthstructural-inhomogeneity strongly affects the optical properties of porous Si. The Si 2p absorption edge of porous Si has been examined with sync
β¦ LIBER β¦
Raman Scattering from Metal-Deposited Porous Silicon
β Scribed by Tetsuo Sakka; Takashi Tsuboi; Yukio H. Ogata; Mahito Mabuchi
- Book ID
- 110275971
- Publisher
- Springer
- Year
- 2000
- Tongue
- English
- Weight
- 40 KB
- Volume
- 7
- Category
- Article
- ISSN
- 1380-2224
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