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Photoluminescence and Raman scattering spectra from porous silicon

✍ Scribed by Koichi Inoue; Kenzo Maehashi; Hisao Nakashima; Osamu Matsuda; Kazuo Murase


Book ID
103918945
Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
316 KB
Volume
12
Category
Article
ISSN
0749-6036

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✦ Synopsis


Depth profiles of photoluminescence (PL) and Raman scattering properties of anodized porous Si have been studied by micro-measurement techniques. The depthstructural-inhomogeneity strongly affects the optical properties of porous Si. The Si 2p absorption edge of porous Si has been examined with synchrotron radiation. It is concluded that the PL blue-shift correlates with the low-energy shift of the Raman peak and with the high-energy shift of the Si 2p absorption edge.


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✍ Walter Jaimes Salcedo; Francisco J. Ramirez Fernandez; Joel C. Rubim πŸ“‚ Article πŸ“… 1999 πŸ› John Wiley and Sons 🌐 English βš– 235 KB πŸ‘ 2 views

The e †ect of di †erent polarization orientations of the excitation source on the Raman and photoluminescence (PL) spectra of a porous silicon (PS) layer within two di †erent micro-regions was investigated. Two micro-regions (2 lm) along the (100) direction were studied, close to the crystalline sil