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Radiation-induced increase in the inversion layer mobility of reoxidized nitrided oxide MOSFETs

โœ Scribed by Dunn, G.J.; Gross, B.J.; Sodini, C.G.


Book ID
114534524
Publisher
IEEE
Year
1992
Tongue
English
Weight
855 KB
Volume
39
Category
Article
ISSN
0018-9383

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