Temperature and field dependence of carrier mobility in MOSFETs with reoxidized nitrided oxide gate dielectrics

✍ Scribed by A.T. Wu; S.W. Lee; T.Y. Chan; V. Murali

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 451 KB
• Volume: 35
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(92)90299-r