✦ LIBER ✦
Effects of radiative processing steps on inversion layer mobility and channel hot carrier damage in reoxidized nitrided oxide mosfets
✍ Scribed by Gregory Dunn; John Krick
- Book ID
- 112815095
- Publisher
- Springer US
- Year
- 1992
- Tongue
- English
- Weight
- 423 KB
- Volume
- 21
- Category
- Article
- ISSN
- 0361-5235
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