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Radiation hardness of Czochralski silicon, Float Zone silicon and oxygenated Float Zone silicon studied by low energy protons

✍ Scribed by J. Härkönen; E. Tuovinen; P. Luukka; E. Tuominen; K. Lassila-Perini; P. Mehtälä; S. Nummela; J. Nysten; A. Zibellini; Z. Li; E. Fretwurst; G. Lindstroem; J. Stahl; F. Hönniger; V. Eremin; A. Ivanov; E. Verbitskaya; P. Heikkilä; V. Ovchinnikov; M. Yli-Koski; P. Laitinen; A. Pirojenko; I. Riihimäki; A. Virtanen

Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 167 KB
Volume: 518
Category: Article
ISSN: 0168-9002
DOI: 10.1016/j.nima.2003.11.018

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