Degradation of high-resistivity float zone and magnetic Czochralski n-type silicon detectors subjected to 2-MeV electron irradiation

✍ Scribed by Rafí, J.M.; Boulord, C.; Hayama, K.; Ohyama, H.; Campabadal, F.; Pellegrini, G.; Lozano, M.; Simoen, E.; Claeys, C.

• Publisher: Elsevier Science
• Year: 2009
• Tongue: English
• Weight: 226 KB
• Volume: 604
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/j.nima.2009.01.114