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Radiation effects and hardening of MOS technology: devices and circuits

✍ Scribed by Hughes, H.L.; Benedetto, J.M.

Book ID: 120057494
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 551 KB
Volume: 50
Category: Article
ISSN: 0018-9499
DOI: 10.1109/TNS.2003.812928

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