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Bias-temperature instabilities and radiation effects in MOS devices

โœ Scribed by Zhou, X.J.; Fleetwood, D.M.; Felix, J.A.; Gusev, E.P.; D'Emic, C.


Book ID
120057495
Publisher
IEEE
Year
2005
Tongue
English
Weight
346 KB
Volume
52
Category
Article
ISSN
0018-9499

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